Test Data Management
Read this section to learn what's new for Test Data Management in version 10.5.
PostgreSQL Support
Effective in version 10.5, you can use a PostgreSQL database to create the Test Data Management repository and the test data warehouse repository.
You can also use the database to create a staging connection and storage connection.
For information, see the Test Data Management 10.5 Configuration Guide.
Sort Entries in a Relational Dictionary
Effective in version 10.5, you can choose to sort the order of entries in a relational dictionary used in a masking plan.
You can sort the order of entries in a dictionary based on the serial number column or any column to ensure that the order remains consistent and generates consistent masked data.
For information about how to configure the option, see the Test Data Management 10.5 User Guide.
Test Data Generation for XSD Sources
Effective in version 10.5, Test Data Generation includes perform the following tasks with XSD sources:
- Use conditional constraints in data generation rules
- You can use conditional constraints in advanced generation rules and ad hoc generation rules with XSD sources.
- For information about how to create and apply advanced generation rules and conditional constraints, see the "Data Generation" chapter in the Test Data Management 10.5 User Guide
- Configure default handling of unbound MaxOccur values
- You can enable default handling of MaxOccurs values that are set as unbound or infinite in an XSD. Use the Default Value for Unbounded MaxOccurs in a Source XSD global-level property to enter a value. The value is added to the MinOccurs value of the element to calculate the MaxOccurs value for the element.
- For information about how to set the property value and override the value for an element, see the Test Data Management 10.5 Administrator Guide and the Test Data Management 10.5 User Guide.